Showing results: 406 - 420 of 502 items found.
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NI
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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FOX-1P -
Aehr Test Systems
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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FA1817 -
HIOKI E.E. Corp
Flying Probe Tester FA1817, an automatic testing system designed to inspect printed wiring on bare boards. The FA1817’s features and capabilities make it ideal for use in inspecting high-density printed wiring boards. With support for a broad range of test types, from low-resistance measurement to high-insulation-resistance measurement, the system reliably detects the latent defects that trouble end-users.
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Fieldpiece Instruments, Inc
The In-Duct Hot-Wire Anemometer & Psychrometer accessory head, AAT3 allows HVACR professionals to measure air velocity, temperature, and %RH all in one tool. The engineered 38" telescoping probe with laser etching and quick-response sensor provides quick and easy airflow measurements from the correct location--near the evaporator. When using with the Fieldpiece HVAC Guide System Analyzers, the AAT3 can automatically calculate target super heat and target evaporator exit temperature.
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AMETEK Sensors, Test & Calibration
Our reference sensors can be used as your daily working-reference sensors in laboratory or field calibration applications. A large selection of types are available, including; straight, 90 degree angle, 4 mm or 1/4”. The superior design and specifications combined with a long history of reliability and low drift have made the STS probes the working-standard in many EN/IEC 17025 accredited laboratories worldwide. The DLC sensors are a part of our patented Dynamic Load Compensation system.
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Rotronic Measurement Solutions
The HygroClip2 is a completely new type of probe in a class of it's own in terms of accuracy and performance. Thanks to the new AirChip3000 technology, it also boasts a unique calibration and adjustment process as well as many other superb innovations. At the same time ROTRONIC has taken humidity measurement technology to a whole new level of performance and reliability: the HygroClip2 offers you the best possible reproducibility and a superb system accuracy of < ±0.8 %rh and ±0.1 K.
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Konica Minolta Sensing Americas, Inc
To measure light radiation’s spectral characteristics, Instrument Systems optical spectroradiometers are the instruments of choice. Instrument Systems has a variety of optical spectroradiometers to meet any user’s needs or budget. Instrument Systems Spectrometers mainly measure UV-VIS spectroradiometry, luminous flux, LED production and LED radiation levels. More importantly, they provide these measurements at a fast rate, gathering data very quickly and efficiently. A number of models come with innovative features that allow the systems to be used universally in a broad range of applications and functions. These systems conveniently change into spectroradiometers when users attach absolute calibration and optical probes. It’s critical that these units maintain a high degree of accuracy and quality in order to return precise calculations of colorimetric, photometric and radiometric data through the built-in software. For these and other reasons, Instrument Systems continues to expand the leading edge of technology by committing the majority of its Research & Development work to this field.
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Smiths Interconnect
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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XP-8500 -
Lorlin Test Systems
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Konica Minolta Sensing Americas, Inc
Instrument Systems General Accessories current range of optical probes and measurement adapters using fiber optics as a means to transport light in the spectrometer was a primary goal sought by Instrument Systems from the beginning of their product development. With the increased research and the recent advances made in fiber optics it is a goal that has come to fruition. Having striven to incorporate fiber optic technology into their spectrometer systems. Instrument Systems has been working on creating top of the line fiber optic accessories. This not only diversifies the already wide application possibilities for Instrument Systems Spectrometers, but makes them more universally and effortlessly installed. Whether it’s measuring spectral transmission properties in normal light incidence, measuring ultra violet or infrared, or collecting radiation and measurements of irradiance, Instrument Systems has developed an accessory to meet your specific needs. For simplicity and ease of use Instrument Systems has made all of their accessories “plug-and-play”. This means installing and expanding the capabilities of your Instrument Systems Spectrometer has never been easier.
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ThermoWorks
Whether standard or high precision, ThermoWorks handheld meters feature rugged housing and best-in class accuracy across a variety of temperature ranges. Choose from integrated systems or meters that accept multiple probes, single or dual channel meters, alarms or reference models. Perfect for BBQ or sous-vide applications, dairy processing and meat processing, pharmaceutical labs, concrete curing, health departments, and for line checks, critical control point management, and HACCP checklists.
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ThermoWorks
Whether standard or high precision, ThermoWorks handheld meters feature rugged housing and best-in class accuracy across a variety of temperature ranges. Choose from integrated systems or meters that accept multiple probes, single or dual channel meters, alarms or reference models. Perfect for BBQ or sous-vide applications, dairy processing and meat processing, pharmaceutical labs, concrete curing, health departments, and for line checks, critical control point management, and HACCP checklists.
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DL6780 -
Di-Log
Testing of AC/ DC voltages from 12 to 690 V AC/DC Continuity testing with optical and acoustic indication Automatic switching between voltage and continuity Phase rotation test system Single pole phase indication Fully compliant with GS38 Fully operational voltage indication even when batteries are discharged Will not trip any RCD when testing across Live and Earth Single pole detection when L2 probe connected above 100V
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MTI Instruments
MTI Instruments'' semiconductor wafer metrology tools consist of a complete line of wafer measurement systems for virtually any material including Silicon wafer (Si), Gallium Arsenide wafer (GaAs), Germanium wafer (Ge) and Indium Phosphide wafer (InP). From manual to semi-automated wafer inspection systems, the Proforma line of wafer metrology inspection tools is ideal for wafer thickness, wafer bow, wafer warp, resistivity, site and global flatness measurement. Our proprietary push/pull capacitance probes provide outstanding accuracy throughout their large measurement range, allowing measurement of highly warped wafers and stacked wafers. MTII''s solar metrology tools include off line manual systems for wafer thickness and Total Thickness Variation (TTV), as well as, in-process measurement systems capable of measuring wafer thickness, TTV and wafer bow at the speed of 5 wafers/second.
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TK9LIN50 -
Techna-Tool Inc.
BK Mikro Linear is based on the existing design concepts for tool, object and free space monitoring and is modified to utilize a rack and pinion probe instead of a wand. This system monitors a specific distance or depth with longitudinal scanning. This is especially useful in cases where rotary scanning is inappropriateorimpossible. Some examples would be cavities, blind or through holes and places where space is limited. It can also be used to verify a part is in place during assembly or that the proper part is on the machine by probing a specific feature.
